Olympus Confocal microscope LEXT OLS photo Description: Confocal laser scanning microscopes allow for observations of three-dimensional shapes, . Olympus Confocal microscope LEXT OLS Description: Confocal laser scanning microscopes allow for observations of three-dimensional shapes, such as. The Olympus LEXT OLS laser scanning confocal microscope, noncontact, nondestructive 3D observations and measurements are easy to produce. Simply .
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Inspection of the processed shape of expanded metal. Measuring the Profile of a Bonding Wire Ball.
The OLS laser confocal microscope precisely measures shape and surface roughness at the submicron level. Best suited for measurement of 1. Even users with minimal training can still obtain accurate results.
This new system allows lezt speedy observation and measurement of fine surface patterns on semiconductors, advanced materials and electronic devices. After importing the image, it is also necessary to carry out various adjustments to obtain ideal images. Evaluation of Oil Grooves on the Sides of Pistons. Surface profile evaluation of materials for lithium-ion battery collectors. Noncontact probing leaves specimen free of scratches. Low power and long working distance objectives are also available in this series.
Quantitative Investigations of the Interconnect. Observation and measurement of profile changes in wiper blades using a laser microscope. Measurement of the inner wall waviness and roughness of a turbocharger housing using a laser microscope.
Burrs on processed metal goods. Conduct the inspection and take measurements.
Olympus: LEXT OLS – Microscopy News
Step measurement of transparent film applied to a glass surface. Looking towards leext Future of Lexxt Solar Energy. Measuring the Thickness of Photoresist Film. Precise imaging Capture the shape of any surface. High-definition observation of the metal structure of materials for thermal power plant piping.
Market growth in related industrial sectors is generating more needs for three-dimensional micro-metrology instruments Advances in technology over the past few years have meanwhile raised the standard of quality management required.
Best suited for the analysis of roughness of about Rz 0.
Alternative Materials for Alternative Energy. Thanks to exclusive Olympus optical technology and improved software algorithms, the LEXT OLS also has the superior height measurement repeatability. The range of contrast methods is completed lexy the optional darkfield capability for detection of scratches and cracks. A volume, capacity, surface area, etc.
Olympus: LEXT OLS3100
kext With other existing instruments, 3D image capturing first requires setting upper and lower import limits according to the height of the specimen. Box Center Valley, PA. This new system improves the efficiency of the 3D observation and metrology.
Dimensional measurement of embossed carrier tape for capacitors. The future of industrial quality control. Information posted on this site is current and accurate only at the time of their original publication date, and may now be outdated or inaccurate. The measurement performance of all dedicated LEXT objectives is guaranteed, so you can select the one best suited to the sample you’re observing.